Infrared Ellipsometry on Semiconductor Layer Structures [electronic resource] : Phonons, Plasmons, and Polaritons / by Mathias Schubert.
By: Schubert, Mathias.
Contributor(s): SpringerLink (Online service).
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BookSeries: Springer Tracts in Modern Physics, 209.Publisher: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005Description: digital.ISBN: 9783540447016.Subject(s): Chemistry | Physical optics | Optical materials | Surfaces (Physics) | Chemistry | Surfaces and Interfaces, Thin Films | Optical and Electronic Materials | Applied Optics, Optoelectronics, Optical Devices | Physics and Applied Physics in EngineeringOnline resources: Click here to access online
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