Schubert, Mathias.
Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons / [electronic resource] : by Mathias Schubert. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2005. - digital. - Springer Tracts in Modern Physics, 209 0081-3869 ; . - Springer Tracts in Modern Physics, 209 .
9783540447016
10.1007/b11964 doi
Chemistry.
Physical optics.
Optical materials.
Surfaces (Physics).
Chemistry.
Surfaces and Interfaces, Thin Films.
Optical and Electronic Materials.
Applied Optics, Optoelectronics, Optical Devices.
Physics and Applied Physics in Engineering.
Infrared Ellipsometry on Semiconductor Layer Structures Phonons, Plasmons, and Polaritons / [electronic resource] : by Mathias Schubert. - Berlin, Heidelberg : Springer Berlin Heidelberg, 2005. - digital. - Springer Tracts in Modern Physics, 209 0081-3869 ; . - Springer Tracts in Modern Physics, 209 .
9783540447016
10.1007/b11964 doi
Chemistry.
Physical optics.
Optical materials.
Surfaces (Physics).
Chemistry.
Surfaces and Interfaces, Thin Films.
Optical and Electronic Materials.
Applied Optics, Optoelectronics, Optical Devices.
Physics and Applied Physics in Engineering.