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Markov Random Field Modeling in Image Analysis [electronic resource] / by Stan Z. Li.

By: Li, Stan Z.
Contributor(s): SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Advances in Pattern Recognition.Publisher: London : Springer London, 2009Description: digital.ISBN: 9781848002791.Subject(s): Computer science | Computer vision | Optical pattern recognition | Computer Science | Mathematics of Computing | Image Processing and Computer Vision | Pattern RecognitionOnline resources: Click here to access online In: Springer eBooks
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