Li, Stan Z.

Markov Random Field Modeling in Image Analysis [electronic resource] / by Stan Z. Li. - London : Springer London, 2009. - digital. - Advances in Pattern Recognition, 1617-7916 . - Advances in Pattern Recognition, .

9781848002791

10.1007/978-1-84800-279-1 doi


Computer science.
Computer vision.
Optical pattern recognition.
Computer Science.
Mathematics of Computing.
Image Processing and Computer Vision.
Pattern Recognition.

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