Precision Landmark Location for Machine Vision and Photogrammetry [electronic resource] : Finding and Achieving the Maximum Possible Accuracy / by Brian S.R. Armstrong, José A. Gutierrez.
By: Armstrong, Brian S.R.
Contributor(s): Gutierrez, José A | SpringerLink (Online service).
Material type:
BookPublisher: London : Springer London, 2008Description: digital.ISBN: 9781846289132.Subject(s): Computer science | Remote sensing | Radiology, Medical | Computer vision | Statistics | Computer Science | Image Processing and Computer Vision | Automation and Robotics | Remote Sensing/Photogrammetry | Signal, Image and Speech Processing | Imaging / Radiology | Statistics for Engineering, Physics, Computer Science, Chemistry & GeosciencesDDC classification: 006.6 | 006.37 Online resources: Click here to access online
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