Armstrong, Brian S.R.
Precision Landmark Location for Machine Vision and Photogrammetry Finding and Achieving the Maximum Possible Accuracy / [electronic resource] : by Brian S.R. Armstrong, José A. Gutierrez. - London : Springer London, 2008. - digital.
9781846289132
10.1007/978-1-84628-913-2 doi
Computer science.
Remote sensing.
Radiology, Medical.
Computer vision.
Statistics.
Computer Science.
Image Processing and Computer Vision.
Automation and Robotics.
Remote Sensing/Photogrammetry.
Signal, Image and Speech Processing.
Imaging / Radiology.
Statistics for Engineering, Physics, Computer Science, Chemistry & Geosciences.
TA1637-1638 TA1637-1638
006.6 006.37
Precision Landmark Location for Machine Vision and Photogrammetry Finding and Achieving the Maximum Possible Accuracy / [electronic resource] : by Brian S.R. Armstrong, José A. Gutierrez. - London : Springer London, 2008. - digital.
9781846289132
10.1007/978-1-84628-913-2 doi
Computer science.
Remote sensing.
Radiology, Medical.
Computer vision.
Statistics.
Computer Science.
Image Processing and Computer Vision.
Automation and Robotics.
Remote Sensing/Photogrammetry.
Signal, Image and Speech Processing.
Imaging / Radiology.
Statistics for Engineering, Physics, Computer Science, Chemistry & Geosciences.
TA1637-1638 TA1637-1638
006.6 006.37