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Extreme Statistics in Nanoscale Memory Design [electronic resource] / edited by Amith Singhee, Rob A. Rutenbar.

By: Singhee, Amith.
Contributor(s): Rutenbar, Rob A | SpringerLink (Online service).
Material type: materialTypeLabelBookSeries: Integrated Circuits and Systems.Publisher: Boston, MA : Springer US, 2010Edition: 1.Description: digital.ISBN: 9781441966063.Subject(s): Engineering | Electronics | Systems engineering | Engineering | Circuits and Systems | Electronics and Microelectronics, InstrumentationDDC classification: 621.3815 Online resources: Click here to access online In: Springer eBooks
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