Singhee, Amith.
Extreme Statistics in Nanoscale Memory Design [electronic resource] / edited by Amith Singhee, Rob A. Rutenbar. - 1. - Boston, MA : Springer US, 2010. - digital. - Integrated Circuits and Systems, 1558-9412 . - Integrated Circuits and Systems, .
9781441966063
10.1007/978-1-4419-6606-3 doi
Engineering.
Electronics.
Systems engineering.
Engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
TK7888.4
621.3815
Extreme Statistics in Nanoscale Memory Design [electronic resource] / edited by Amith Singhee, Rob A. Rutenbar. - 1. - Boston, MA : Springer US, 2010. - digital. - Integrated Circuits and Systems, 1558-9412 . - Integrated Circuits and Systems, .
9781441966063
10.1007/978-1-4419-6606-3 doi
Engineering.
Electronics.
Systems engineering.
Engineering.
Circuits and Systems.
Electronics and Microelectronics, Instrumentation.
TK7888.4
621.3815