Scanning Probe Microscopy [electronic resource] : Atomic Scale Engineering by Forces and Currents / by Adam Foster, Werner Hofer.
By: Foster, Adam.
Contributor(s): Hofer, Werner | SpringerLink (Online service).
Material type:
BookSeries: NanoScience and Technology.Publisher: New York, NY : Springer New York, 2006Description: digital.ISBN: 9780387372310.Subject(s): Chemistry | Microscopy | Molecular structure | Particles (Nuclear physics) | Nanotechnology | Surfaces (Physics) | Chemistry | Characterization and Evaluation of Materials | Nanotechnology | Surfaces and Interfaces, Thin Films | Atomic and Molecular Structure and Spectra | Solid State Physics and Spectroscopy | Biological MicroscopyOnline resources: Click here to access online
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