Foster, Adam.
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents / [electronic resource] : by Adam Foster, Werner Hofer. - New York, NY : Springer New York, 2006. - digital. - NanoScience and Technology, 1434-4904 . - NanoScience and Technology, .
9780387372310
10.1007/0-387-37231-8 doi
Chemistry.
Microscopy.
Molecular structure.
Particles (Nuclear physics).
Nanotechnology.
Surfaces (Physics).
Chemistry.
Characterization and Evaluation of Materials.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Atomic and Molecular Structure and Spectra.
Solid State Physics and Spectroscopy.
Biological Microscopy.
Scanning Probe Microscopy Atomic Scale Engineering by Forces and Currents / [electronic resource] : by Adam Foster, Werner Hofer. - New York, NY : Springer New York, 2006. - digital. - NanoScience and Technology, 1434-4904 . - NanoScience and Technology, .
9780387372310
10.1007/0-387-37231-8 doi
Chemistry.
Microscopy.
Molecular structure.
Particles (Nuclear physics).
Nanotechnology.
Surfaces (Physics).
Chemistry.
Characterization and Evaluation of Materials.
Nanotechnology.
Surfaces and Interfaces, Thin Films.
Atomic and Molecular Structure and Spectra.
Solid State Physics and Spectroscopy.
Biological Microscopy.