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Physical Principles of Electron Microscopy [electronic resource] : An Introduction to TEM, SEM, and AEM / by Ray F. Egerton.

By: Egerton, Ray F.
Contributor(s): SpringerLink (Online service).
Material type: materialTypeLabelBookPublisher: Boston, MA : Springer US, 2005Description: digital.ISBN: 9780387260167.Subject(s): Chemistry | Microscopy | Electromagnetism | Nanotechnology | Surfaces (Physics) | Chemistry | Characterization and Evaluation of Materials | Nanotechnology | Biological Microscopy | Electromagnetism, Optics and LasersOnline resources: Click here to access online In: Springer eBooks
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