Egerton, Ray F.
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM / [electronic resource] : by Ray F. Egerton. - Boston, MA : Springer US, 2005. - digital.
9780387260167
10.1007/b136495 doi
Chemistry.
Microscopy.
Electromagnetism.
Nanotechnology.
Surfaces (Physics).
Chemistry.
Characterization and Evaluation of Materials.
Nanotechnology.
Biological Microscopy.
Electromagnetism, Optics and Lasers.
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM / [electronic resource] : by Ray F. Egerton. - Boston, MA : Springer US, 2005. - digital.
9780387260167
10.1007/b136495 doi
Chemistry.
Microscopy.
Electromagnetism.
Nanotechnology.
Surfaces (Physics).
Chemistry.
Characterization and Evaluation of Materials.
Nanotechnology.
Biological Microscopy.
Electromagnetism, Optics and Lasers.