Gusev, Evgeni.
Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices / [electronic resource] : edited by Evgeni Gusev. - Dordrecht : Springer Netherlands, 2006. - digital. - NATO Science Series II: Mathematics, Physics and Chemistry, 220 1568-2609 ; . - NATO Science Series II: Mathematics, Physics and Chemistry, 220 .
9781402043673
10.1007/1-4020-4367-8 doi
Engineering.
Condensed matter.
Electronics.
Engineering.
Electronic and Computer Engineering.
Condensed Matter.
Physics and Applied Physics in Engineering.
Electronics and Microelectronics, Instrumentation.
TK1-9971
621.3
Defects in High-k Gate Dielectric Stacks Nano-Electronic Semiconductor Devices / [electronic resource] : edited by Evgeni Gusev. - Dordrecht : Springer Netherlands, 2006. - digital. - NATO Science Series II: Mathematics, Physics and Chemistry, 220 1568-2609 ; . - NATO Science Series II: Mathematics, Physics and Chemistry, 220 .
9781402043673
10.1007/1-4020-4367-8 doi
Engineering.
Condensed matter.
Electronics.
Engineering.
Electronic and Computer Engineering.
Condensed Matter.
Physics and Applied Physics in Engineering.
Electronics and Microelectronics, Instrumentation.
TK1-9971
621.3