000			03721nam a22005175i 4500
001			978-1-4614-8721-0
003			DE-He213
005			20140220082832.0
007			cr nn 008mamaa
008			131207s2013 xxu| s |||| 0|eng d
020			_a9781461487210 _9978-1-4614-8721-0
024	7		_a10.1007/978-1-4614-8721-0 _2doi
050		4	_aTA404.6
072		7	_aTGMT _2bicssc
072		7	_aTEC021000 _2bisacsh
082	0	4	_a620.11 _223
100	1		_aLarson, David J. _eauthor.
245	1	0	_aLocal Electrode Atom Probe Tomography _h[electronic resource] : _bA User's Guide / _cby David J. Larson, Ty J. Prosa, Robert M. Ulfig, Brian P. Geiser, Thomas F. Kelly.
264		1	_aNew York, NY : _bSpringer New York : _bImprint: Springer, _c2013.
300			_aXVII, 318 p. 164 illus., 54 illus. in color. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
505	0		_aPreface -- Acknowledgements -- Foreword -- Abbreviations -- Chapter 1. History of APT and LEAP -- Chapter 2. Specimen Preparation -- Chapter 3. Design & Instrumentation -- Chapter 4. Data Collection -- Chapter 5. Data Processing and Reconstruction -- Chapter 6. Selected Analysis Topics -- Chapter 7. Applications of the Local Electrode Atom Probe -- Appendix A. Data File Formats -- Appendix B. Field Evaporation -- Appendix C. Reconstruction Geometry -- Appendix D. Mass Spectral Performance -- Appendix E. Additional Considerations for LEAP Operation -- Glossary -- Index.
520			_aThis book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope. Written from the user perspective by the developers of the instrument themselves Covers the main features of a local electrode atom probe tomography experiment from start to finish Contains practical hints and  tutorial information that is useful to any atom probe operator to improve the chances of a  successful analysis Includes a chapter on hardware/instrumentation, which explains to the novice user the various parts of the instrument and how they operate Provides an overview of the software methods employed in LEAP, including reconstruction and data analysis
650		0	_aNanochemistry.
650		0	_aNanotechnology.
650		0	_aSurfaces (Physics).
650	1	4	_aMaterials Science.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aNanoscale Science and Technology.
650	2	4	_aNanochemistry.
650	2	4	_aSpectroscopy and Microscopy.
650	2	4	_aNanotechnology.
700	1		_aProsa, Ty J. _eauthor.
700	1		_aUlfig, Robert M. _eauthor.
700	1		_aGeiser, Brian P. _eauthor.
700	1		_aKelly, Thomas F. _eauthor.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781461487203
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4614-8721-0
912			_aZDB-2-CMS
999			_c96082 _d96082