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001 978-1-4614-4587-6
003 DE-He213
005 20140220082816.0
007 cr nn 008mamaa
008 121120s2013 xxu| s |||| 0|eng d
020 _a9781461445876
_9978-1-4614-4587-6
024 7 _a10.1007/978-1-4614-4587-6
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _avan Roermund, Arthur H.M.
_eeditor.
245 1 0 _aNyquist AD Converters, Sensor Interfaces, and Robustness
_h[electronic resource] :
_bAdvances in Analog Circuit Design, 2012 /
_cedited by Arthur H.M. van Roermund, Andrea Baschirotto, Michiel Steyaert.
264 1 _aNew York, NY :
_bSpringer New York :
_bImprint: Springer,
_c2013.
300 _aX, 291 p. 230 illus., 77 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
505 0 _aPart I: Nyquist A/D Converters -- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes -- Dual Residue Pipeline ADC -- Time-Interleaved SAR and Slope Converters -- GS/s AD Conversion for Broadband Multi-Stream Reception -- CMOS Ultra High-Speed Time-Interleaved ADCs -- CMOS ADCs for Optical Communications -- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow -- Energy-Efficient Capacitive Sensor Interfaces -- Interface Circuits for MEMS Microphones -- Front-End Electronics for Solid State Detectors in Present and Future High-Energy Physics Experiments -- Part III: Robustness -- How Can Chips Live Under Radiation? -- TDC and Rad Environments -- Matching and Resolution -- Matching in Polymer and Effect on Circuit Topologies -- Statistical Variability and Reliability in Nano-CMOS Transistors.
520 _aThis book is based on the presentations during the 21st workshop on Advances in Analog Circuit Design.  Expert designers provide readers with information about a variety of topics at the frontier of analog circuit design, including Nyquist analog-to-digital converters, capacitive sensor interfaces, reliability, variability, and connectivity.  This book serves as a valuable reference to the state-of-the-art, for anyone involved in analog circuit research and development.  Provides a state-of-the-art reference in analog circuit design, written by experts from industry and academia; Presents material in a tutorial-based format; Includes coverage of Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.
650 0 _aEngineering.
650 0 _aElectronics.
650 0 _aSystems engineering.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
700 1 _aBaschirotto, Andrea.
_eeditor.
700 1 _aSteyaert, Michiel.
_eeditor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781461445869
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4614-4587-6
912 _aZDB-2-ENG
999 _c95180
_d95180