000			03301nam a22004935i 4500
001			978-4-431-54448-7
003			DE-He213
005			20140220082525.0
007			cr nn 008mamaa
008			130911s2014 ja | s |||| 0|eng d
020			_a9784431544487 _9978-4-431-54448-7
024	7		_a10.1007/978-4-431-54448-7 _2doi
050		4	_aQC450-467
050		4	_aQC718.5.S6
072		7	_aPNFS _2bicssc
072		7	_aPDND _2bicssc
072		7	_aSCI078000 _2bisacsh
082	0	4	_a621.36 _223
100	1		_aYoshimura, Nagamitsu. _eauthor.
245	1	0	_aHistorical Evolution Toward Achieving Ultrahigh Vacuum in JEOL Electron Microscopes _h[electronic resource] / _cby Nagamitsu Yoshimura.
264		1	_aTokyo : _bSpringer Japan : _bImprint: Springer, _c2014.
300			_aXI, 125 p. 86 illus., 3 illus. in color. _bonline resource.
336			_atext _btxt _2rdacontent
337			_acomputer _bc _2rdamedia
338			_aonline resource _bcr _2rdacarrier
347			_atext file _bPDF _2rda
490	1		_aSpringerBriefs in Applied Sciences and Technology, _x2191-530X
505	0		_aIntroduction of the electron microscope -- History of JEOL electron microscopes -- Accidents and information, instructing us to improve the vacuum systems of JEMs -- Development of the evacuation systems for JEMs -- Development of JEOL SIPs -- Ultrahigh vacuum electron microscopes.
520			_aThis book describes the developmental history of the vacuum system of the transmission electron microscope (TEM) at the Japan Electron Optics Laboratory (JEOL) from its inception to its use in today’s high-technology microscopes. The author and his colleagues were engaged in developing vacuum technology for electron microscopes (JEM series) at JEOL for many years. This volume presents a summary and explanation of their work and the technology that makes possible a clean ultrahigh vacuum. The typical users of the TEM are top-level researchers working at the frontiers of new materials or with new biological specimens. They often use the TEM under extremely severe conditions, with problems sometimes occurring in the vacuum system of the microscopes. JEOL engineers then must work as quickly as possible to improve the vacuum evacuation system so as to prevent the recurrence of such problems. Among the wealth of explanatory material in this book are examples of users’ reports of problems in the vacuum system of the JEM, such as the occurrence of a micro-discharge and the back-streaming of the diffusion pump (DP) oil vapor. This work is a valuable resource for researchers who use the transmission electron microscope and for engineers and scientists interested in its technology.
650		0	_aPhysics.
650		0	_aEngineering.
650	1	4	_aPhysics.
650	2	4	_aSpectroscopy and Microscopy.
650	2	4	_aNanotechnology and Microengineering.
650	2	4	_aMachinery and Machine Elements.
650	2	4	_aMeasurement Science and Instrumentation.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9784431544470
830		0	_aSpringerBriefs in Applied Sciences and Technology, _x2191-530X
856	4	0	_uhttp://dx.doi.org/10.1007/978-4-431-54448-7
912			_aZDB-2-PHA
999			_c93692 _d93692