| 000 | 03597nam a22005415i 4500 | ||
|---|---|---|---|
| 001 | 978-3-642-40594-5 | ||
| 003 | DE-He213 | ||
| 005 | 20140220082521.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 131204s2014 gw | s |||| 0|eng d | ||
| 020 |
_a9783642405945 _9978-3-642-40594-5 |
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| 024 | 7 |
_a10.1007/978-3-642-40594-5 _2doi |
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| 050 | 4 | _aTA1671-1707 | |
| 050 | 4 | _aTA1501-1820 | |
| 072 | 7 |
_aTTBL _2bicssc |
|
| 072 | 7 |
_aTEC019000 _2bisacsh |
|
| 082 | 0 | 4 |
_a621.36 _223 |
| 100 | 1 |
_aShudo, Ken-ichi. _eeditor. |
|
| 245 | 1 | 0 |
_aFrontiers in Optical Methods _h[electronic resource] : _bNano-Characterization and Coherent Control / _cedited by Ken-ichi Shudo, Ikufumui Katayama, Shin-Ya Ohno. |
| 264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg : _bImprint: Springer, _c2014. |
|
| 300 |
_aXII, 228 p. 139 illus., 70 illus. in color. _bonline resource. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
||
| 338 |
_aonline resource _bcr _2rdacarrier |
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| 347 |
_atext file _bPDF _2rda |
||
| 490 | 1 |
_aSpringer Series in Optical Sciences, _x0342-4111 ; _v180 |
|
| 505 | 0 | _aState-of-Art of Terahertz Science and Technology -- Broadband Terahertz Spectroscopy and its Application to the Characterization of Thin Films -- Single Photon Counting and Passive Microscopy of Terahertz Radiation -- Coherent Phonons in Carbon Nanotubes -- Time-resolved X-ray Diffraction Studies of Coherent Lattice Dynamics Using Synchrotron Radiation -- Imaging GHz-THz Acoustic Wave Propagation in Thin Films and Microstructures -- Material Evaluation with Various Optical Measurement Systems: Focusing on Terahertz Spectroscopy -- Ultrafast Excitation and Dynamics Measurements with Intense Ultrashort Laser Pulses: High-Order Harmonic Generation from Aligning Molecules and Surface Nanostructuring -- Real Space Mapping of Exciton Interaction Strength in GaN Films by using Four-Wave-Mixing Technique -- Terahertz Light Source Based on Synchrotron Radiation -- Terahertz Synchrotron Radiation; Optics and Application -- Far-infrared Spectroscopy on Solids under Ultra High Pressures -- Real-time Analysis of Initial Oxidation Process on Si(001) by Means of Surface Differential Reflectance Spectroscopy and Reflectance Difference Spectroscopy. | |
| 520 | _aThis collection of reviews by leading Japanese researchers covers topics like ultrafast optical responses, terahertz and phonon studies, super-sensitive surface and high-pressure spectroscopy, combination of visible and x-ray photonics. Several related areas at the cutting edge of measurement technology and materials science are included. This book is partly based on well-cited review articles in the Japanese language in special volumes of the Journal of the Vacuum Society of Japan. | ||
| 650 | 0 | _aPhysics. | |
| 650 | 0 | _aMicrowaves. | |
| 650 | 0 | _aNanotechnology. | |
| 650 | 1 | 4 | _aPhysics. |
| 650 | 2 | 4 | _aLaser Technology, Photonics. |
| 650 | 2 | 4 | _aAtomic, Molecular, Optical and Plasma Physics. |
| 650 | 2 | 4 | _aOptics, Optoelectronics, Plasmonics and Optical Devices. |
| 650 | 2 | 4 | _aSpectroscopy and Microscopy. |
| 650 | 2 | 4 | _aMicrowaves, RF and Optical Engineering. |
| 650 | 2 | 4 | _aNanotechnology. |
| 700 | 1 |
_aKatayama, Ikufumui. _eeditor. |
|
| 700 | 1 |
_aOhno, Shin-Ya. _eeditor. |
|
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9783642405938 |
| 830 | 0 |
_aSpringer Series in Optical Sciences, _x0342-4111 ; _v180 |
|
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-642-40594-5 |
| 912 | _aZDB-2-PHA | ||
| 999 |
_c93433 _d93433 |
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