| 000 | 03046nam a22005295i 4500 | ||
|---|---|---|---|
| 001 | 978-3-642-40128-2 | ||
| 003 | DE-He213 | ||
| 005 | 20140220082520.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 131024s2014 gw | s |||| 0|eng d | ||
| 020 |
_a9783642401282 _9978-3-642-40128-2 |
||
| 024 | 7 |
_a10.1007/978-3-642-40128-2 _2doi |
|
| 050 | 4 | _aQC176.8.S8 | |
| 050 | 4 | _aQC611.6.S9 | |
| 050 | 4 | _aQC176.84.S93 | |
| 072 | 7 |
_aPHFC _2bicssc |
|
| 072 | 7 |
_aSCI077000 _2bisacsh |
|
| 082 | 0 | 4 |
_a530.417 _223 |
| 100 | 1 |
_aHinrichs, Karsten. _eeditor. |
|
| 245 | 1 | 0 |
_aEllipsometry of Functional Organic Surfaces and Films _h[electronic resource] / _cedited by Karsten Hinrichs, Klaus-Jochen Eichhorn. |
| 264 | 1 |
_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg : _bImprint: Springer, _c2014. |
|
| 300 |
_aXXI, 363 p. 216 illus., 55 illus. in color. _bonline resource. |
||
| 336 |
_atext _btxt _2rdacontent |
||
| 337 |
_acomputer _bc _2rdamedia |
||
| 338 |
_aonline resource _bcr _2rdacarrier |
||
| 347 |
_atext file _bPDF _2rda |
||
| 490 | 1 |
_aSpringer Series in Surface Sciences, _x0931-5195 ; _v52 |
|
| 505 | 0 | _aBiomolecules at surfaces -- Smart polymer surfaces and films -- Nanostructured surfaces and organic/inorganic hybrids -- Thin films of organic semiconductors for OPV, OLEDs and OTFT -- Developments in ellipsometric real-time/in-situ monitoring techniques -- Infrared brillant light sources for micro-ellipsometric studies of organic films -- Collection of optical constants of organic layers. | |
| 520 | _aEllipsometry is the method of choice to determine the properties of surfaces and thin films. It provides comprehensive and sensitive characterization in contactless and non-invasive measurements. This book gives a state-of-the-art survey of ellipsometric investigations of organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. In conjunction with the development of functional organic, meta- and hybrid materials for new optical, electronic, sensing and biotechnological devices and fabrication advances, the ellipsometric analysis of their optical and material properties has progressed rapidly in the recent years. | ||
| 650 | 0 | _aPhysics. | |
| 650 | 0 | _aChemistry, Physical organic. | |
| 650 | 0 | _aSurfaces (Physics). | |
| 650 | 1 | 4 | _aPhysics. |
| 650 | 2 | 4 | _aSurface and Interface Science, Thin Films. |
| 650 | 2 | 4 | _aSurfaces and Interfaces, Thin Films. |
| 650 | 2 | 4 | _aPhysical Chemistry. |
| 650 | 2 | 4 | _aOptics, Optoelectronics, Plasmonics and Optical Devices. |
| 650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
| 700 | 1 |
_aEichhorn, Klaus-Jochen. _eeditor. |
|
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9783642401275 |
| 830 | 0 |
_aSpringer Series in Surface Sciences, _x0931-5195 ; _v52 |
|
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-642-40128-2 |
| 912 | _aZDB-2-CMS | ||
| 999 |
_c93393 _d93393 |
||