000 03117nam a22005055i 4500
001 978-3-642-38177-5
003 DE-He213
005 20140220082517.0
007 cr nn 008mamaa
008 130906s2014 gw | s |||| 0|eng d
020 _a9783642381775
_9978-3-642-38177-5
024 7 _a10.1007/978-3-642-38177-5
_2doi
050 4 _aT50
072 7 _aPDDM
_2bicssc
072 7 _aSCI068000
_2bisacsh
082 0 4 _a530.8
_223
100 1 _aBenediktovich, Andrei.
_eauthor.
245 1 0 _aTheoretical Concepts of X-Ray Nanoscale Analysis
_h[electronic resource] :
_bTheory and Applications /
_cby Andrei Benediktovich, Ilya Feranchuk, Alexander Ulyanenkov.
264 1 _aBerlin, Heidelberg :
_bSpringer Berlin Heidelberg :
_bImprint: Springer,
_c2014.
300 _aXIII, 318 p. 108 illus., 37 illus. in color.
_bonline resource.
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
347 _atext file
_bPDF
_2rda
490 1 _aSpringer Series in Materials Science,
_x0933-033X ;
_v183
505 0 _aBasic principles of the interaction between X-rays and matter -- X-ray reflectivity -- High-resolution X-ray diffraction -- Grazing-incidence small-angle X-ray scattering -- Theory of X-ray scattering from imperfect crystals -- X-ray diffraction for evaluation of residual stresses in polycrystals -- Methods of mathematical and physical optimization of X-ray data analysis.
520 _aThis book provides a concise survey of modern theoretical concepts of X-ray materials analysis. The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis. All the theoretical methods presented use the unified physical approach. This makes the book especially useful for readers learning and performing data analysis with different techniques. The theory is applicable to studies of bulk materials of all kinds, including single crystals and polycrystals as well as to surface studies under grazing incidence. The book appeals to researchers and graduate students alike.
650 0 _aPhysics.
650 0 _aSurfaces (Physics).
650 1 4 _aPhysics.
650 2 4 _aMeasurement Science and Instrumentation.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aTheoretical, Mathematical and Computational Physics.
650 2 4 _aApplied and Technical Physics.
650 2 4 _aSpectroscopy and Microscopy.
700 1 _aFeranchuk, Ilya.
_eauthor.
700 1 _aUlyanenkov, Alexander.
_eauthor.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783642381768
830 0 _aSpringer Series in Materials Science,
_x0933-033X ;
_v183
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-642-38177-5
912 _aZDB-2-PHA
999 _c93228
_d93228