| 000 | 02834nam a22004935i 4500 | ||
|---|---|---|---|
| 001 | 978-3-319-01991-8 | ||
| 003 | DE-He213 | ||
| 005 | 20140220082510.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 131024s2014 gw | s |||| 0|eng d | ||
| 020 |
_a9783319019918 _9978-3-319-01991-8 |
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| 024 | 7 |
_a10.1007/978-3-319-01991-8 _2doi |
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| 050 | 4 | _aQC610.9-611.8 | |
| 072 | 7 |
_aTJFD5 _2bicssc |
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| 072 | 7 |
_aTEC008090 _2bisacsh |
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| 082 | 0 | 4 |
_a537.622 _223 |
| 100 | 1 |
_aDi Pietro, Paola. _eauthor. |
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| 245 | 1 | 0 |
_aOptical Properties of Bismuth-Based Topological Insulators _h[electronic resource] / _cby Paola Di Pietro. |
| 264 | 1 |
_aCham : _bSpringer International Publishing : _bImprint: Springer, _c2014. |
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| 300 |
_aX, 119 p. 78 illus., 36 illus. in color. _bonline resource. |
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| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 347 |
_atext file _bPDF _2rda |
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| 490 | 1 |
_aSpringer Theses, Recognizing Outstanding Ph.D. Research, _x2190-5053 |
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| 505 | 0 | _aList of Abbreviations -- Supervisor's Foreword -- 1 Introduction to the Topological Insulators and State of the Art -- 2 Experimental Technique, Sample Fabrication and Models for Data Analysis -- 3 Results and Analysis. | |
| 520 | _aTopological Insulators (TIs) are insulators in the bulk, but have exotic metallic states at their surfaces. The topology, associated with the electronic wavefunctions of these systems, changes when passing from the bulk to the surface.This work studies, by means of infrared spectroscopy, the low energy optical conductivity of Bismuth based TIs in order to identify the extrinsic charge contribution of the bulk and to separate it from the intrinsic contribution of the surface state carriers. The extensive results presented in this thesis definitely shows the 2D character of the carriers in Bismuth-based topological insulators. The experimental apparatus and the FTIR technique, the theory of optical properties and Surface Plasmon Polaritons, as well as sample preparation of both crystals and thin films, and the analysis procedures are thoroughly described. | ||
| 650 | 0 | _aPhysics. | |
| 650 | 0 | _aOptical materials. | |
| 650 | 0 | _aSurfaces (Physics). | |
| 650 | 1 | 4 | _aPhysics. |
| 650 | 2 | 4 | _aSemiconductors. |
| 650 | 2 | 4 | _aOptical and Electronic Materials. |
| 650 | 2 | 4 | _aSolid State Physics. |
| 650 | 2 | 4 | _aSurfaces and Interfaces, Thin Films. |
| 650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9783319019901 |
| 830 | 0 |
_aSpringer Theses, Recognizing Outstanding Ph.D. Research, _x2190-5053 |
|
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-3-319-01991-8 |
| 912 | _aZDB-2-PHA | ||
| 999 |
_c92787 _d92787 |
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