000 01203nam a22003735i 4500
001 978-3-7091-0382-1
003 DE-He213
005 20130515022301.0
007 cr nn 008mamaa
008 110106s2011 au | s |||| 0|eng d
020 _a9783709103821
_9978-3-7091-0382-1
024 7 _a10.1007/978-3-7091-0382-1
_2doi
050 4 _aTK7800-8360
050 4 _aTK7874-7874.9
072 7 _aTJF
_2bicssc
072 7 _aTEC008000
_2bisacsh
082 0 4 _a621.381
_223
100 1 _aSverdlov, Viktor.
245 1 0 _aStrain-Induced Effects in Advanced MOSFETs
_h[electronic resource] /
_cby Viktor Sverdlov.
260 _aVienna :
_bSpringer Vienna,
_c2011.
300 _bdigital.
490 0 _aComputational Microelectronics,
_x0179-0307
650 0 _aEngineering.
650 0 _aElectronics.
650 1 4 _aEngineering.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9783709103814
830 0 _aComputational Microelectronics,
_x0179-0307
856 4 0 _uhttp://dx.doi.org/10.1007/978-3-7091-0382-1
912 _aZDB-2-ENG
999 _c85896
_d85896