000			01616nam a22004455i 4500
001			978-3-642-20233-9
003			DE-He213
005			20130515022159.0
007			cr nn 008mamaa
008			110331s2011 gw | s |||| 0|eng d
020			_a9783642202339 _9978-3-642-20233-9
024	7		_a10.1007/978-3-642-20233-9 _2doi
050		4	_aTK7800-8360
050		4	_aTK7874-7874.9
072		7	_aTJF _2bicssc
072		7	_aTEC008000 _2bisacsh
082	0	4	_a621.381 _223
100	1		_aCataldo, Andrea.
245	1	0	_aBroadband Reflectometry for Enhanced Diagnostics and Monitoring Applications _h[electronic resource] / _cby Andrea Cataldo, Egidio De Benedetto, Giuseppe Cannazza.
260			_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2011.
300			_bdigital.
490	0		_aLecture Notes in Electrical Engineering, _x1876-1100 ; _v93
650		0	_aEngineering.
650		0	_aMicrowaves.
650		0	_aElectronics.
650	1	4	_aEngineering.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aMicrowaves, RF and Optical Engineering.
650	2	4	_aMeasurement Science and Instrumentation.
650	2	4	_aOptics, Optoelectronics, Plasmonics and Optical Devices.
700	1		_aDe Benedetto, Egidio.
700	1		_aCannazza, Giuseppe.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9783642202322
830		0	_aLecture Notes in Electrical Engineering, _x1876-1100 ; _v93
856	4	0	_uhttp://dx.doi.org/10.1007/978-3-642-20233-9
912			_aZDB-2-ENG
999			_c84962 _d84962