000			01438nam a22004215i 4500
001			978-3-642-16635-8
003			DE-He213
005			20130515022127.0
007			cr nn 008mamaa
008			110317s2011 gw | s |||| 0|eng d
020			_a9783642166358 _9978-3-642-16635-8
024	7		_a10.1007/978-3-642-16635-8 _2doi
050		4	_aTA404.6
072		7	_aTGMT _2bicssc
072		7	_aTEC021000 _2bisacsh
082	0	4	_a620.11 _223
100	1		_aWaseda, Yoshio.
245	1	0	_aX-Ray Diffraction Crystallography _h[electronic resource] : _bIntroduction, Examples and Solved Problems / _cby Yoshio Waseda, Eiichiro Matsubara, Kozo Shinoda.
260			_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2011.
300			_bdigital.
650		0	_aCrystallography.
650		0	_aEngineering.
650		0	_aSurfaces (Physics).
650	1	4	_aMaterials Science.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aCrystallography.
650	2	4	_aNanotechnology and Microengineering.
650	2	4	_aSolid State Physics.
650	2	4	_aSpectroscopy and Microscopy.
700	1		_aMatsubara, Eiichiro.
700	1		_aShinoda, Kozo.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9783642166341
856	4	0	_uhttp://dx.doi.org/10.1007/978-3-642-16635-8
912			_aZDB-2-CMS
999			_c84317 _d84317