000			01346nam a22003855i 4500
001			978-3-540-73886-2
003			DE-He213
005			20130515021651.0
007			cr nn 008mamaa
008			100301s2008 gw | s |||| 0|eng d
020			_a9783540738862 _9978-3-540-73886-2
024	7		_a10.1007/978-3-540-73886-2 _2doi
100	1		_aFultz, Brent.
245	1	0	_aTransmission Electron Microscopy and Diffractometry of Materials _h[electronic resource] / _cby Brent Fultz, James M. Howe.
250			_aThird Edition.
260			_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2008.
300			_bdigital.
650		0	_aChemistry.
650		0	_aParticles (Nuclear physics).
650		0	_aCrystallography.
650		0	_aSurfaces (Physics).
650	1	4	_aChemistry.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aSurfaces and Interfaces, Thin Films.
650	2	4	_aCrystallography.
650	2	4	_aSolid State Physics and Spectroscopy.
650	2	4	_aPhysics and Applied Physics in Engineering.
700	1		_aHowe, James M.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9783540738855
856	4	0	_uhttp://dx.doi.org/10.1007/978-3-540-73886-2
912			_aZDB-2-CMS
999			_c79516 _d79516