000			01265nam a22003735i 4500
001			978-3-540-34315-8
003			DE-He213
005			20130515021440.0
007			cr nn 008mamaa
008			100301s2007 gw | s |||| 0|eng d
020			_a9783540343158 _9978-3-540-34315-8
024	7		_a10.1007/978-3-540-34315-8 _2doi
100	1		_aMorita, Seizo.
245	1	0	_aRoadmap of Scanning Probe Microscopy _h[electronic resource] / _cedited by Seizo Morita.
260			_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2007.
300			_bdigital.
490	0		_aNanoScience and Technology, _x1434-4904
650		0	_aChemistry.
650		0	_aCondensed matter.
650		0	_aNanotechnology.
650		0	_aSurfaces (Physics).
650	1	4	_aChemistry.
650	2	4	_aNanotechnology.
650	2	4	_aCondensed Matter.
650	2	4	_aPhysics and Applied Physics in Engineering.
650	2	4	_aSurfaces and Interfaces, Thin Films.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9783540343141
830		0	_aNanoScience and Technology, _x1434-4904
856	4	0	_uhttp://dx.doi.org/10.1007/978-3-540-34315-8
912			_aZDB-2-CMS
999			_c77341 _d77341