000			01444nam a22003855i 4500
001			978-3-540-31915-3
003			DE-He213
005			20130515021349.0
007			cr nn 008mamaa
008			100301s2005 gw | s |||| 0|eng d
020			_a9783540319153 _9978-3-540-31915-3
024	7		_a10.1007/3-540-31915-8 _2doi
100	1		_aCullis, A. G.
245	1	0	_aMicroscopy of Semiconducting Materials _h[electronic resource] : _bProceedings of the 14th Conference, April 11–14, 2005, Oxford, UK / _cedited by A. G. Cullis, J. L. Hutchison.
260			_aBerlin, Heidelberg : _bSpringer Berlin Heidelberg, _c2005.
300			_bdigital.
490	0		_aSpringer Proceedings in Physics, _x0930-8989 ; _v107
650		0	_aChemistry.
650		0	_aWeights and measures.
650		0	_aParticles (Nuclear physics).
650		0	_aElectronics.
650	1	4	_aChemistry.
650	2	4	_aMaterials Science.
650	2	4	_aSolid State Physics and Spectroscopy.
650	2	4	_aMeasurement Science, Instrumentation.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
700	1		_aHutchison, J. L.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9783540319146
830		0	_aSpringer Proceedings in Physics, _x0930-8989 ; _v107
856	4	0	_uhttp://dx.doi.org/10.1007/3-540-31915-8
912			_aZDB-2-CMS
999			_c76560 _d76560