000			01618nam a22004575i 4500
001			978-1-84882-059-3
003			DE-He213
005			20130515021154.0
007			cr nn 008mamaa
008			100301s2009 xxk| s |||| 0|eng d
020			_a9781848820593 _9978-1-84882-059-3
024	7		_a10.1007/978-1-84882-059-3 _2doi
050		4	_aQC176-176.9
072		7	_aPNFS _2bicssc
072		7	_aSCI077000 _2bisacsh
082	0	4	_a530.41 _223
100	1		_aSeebauer, Edmund G.
245	1	0	_aCharged Semiconductor Defects _h[electronic resource] : _bStructure, Thermodynamics and Diffusion / _cby Edmund G. Seebauer, Meredith C. Kratzer.
260			_aLondon : _bSpringer London, _c2009.
300			_bdigital.
490	0		_aEngineering Materials and Processes, _x1619-0181
650		0	_aPhysics.
650		0	_aParticles (Nuclear physics).
650		0	_aMaterials.
650		0	_aElectronics.
650		0	_aOptical materials.
650	1	4	_aPhysics.
650	2	4	_aSolid State Physics and Spectroscopy.
650	2	4	_aOptical and Electronic Materials.
650	2	4	_aContinuum Mechanics and Mechanics of Materials.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aEngineering Thermodynamics, Transport Phenomena.
700	1		_aKratzer, Meredith C.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781848820586
830		0	_aEngineering Materials and Processes, _x1619-0181
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-84882-059-3
912			_aZDB-2-PHA
999			_c74601 _d74601