000 01389nam a22004335i 4500
001 978-1-84628-173-0
003 DE-He213
005 20130515021130.0
007 cr nn 008mamaa
008 100301s2006 xxk| s |||| 0|eng d
020 _a9781846281730
_9978-1-84628-173-0
024 7 _a10.1007/1-84628-173-3
_2doi
050 4 _aTK7888.4
072 7 _aTJFC
_2bicssc
072 7 _aTEC008010
_2bisacsh
082 0 4 _a621.3815
_223
100 1 _aGrout, Ian A.
245 1 0 _aIntegrated Circuit Test Engineering
_h[electronic resource] :
_bModern Techniques /
_cby Ian A. Grout.
260 _aLondon :
_bSpringer London,
_c2006.
300 _bdigital.
650 0 _aEngineering.
650 0 _aComputer hardware.
650 0 _aComputer system performance.
650 0 _aIndustrial engineering.
650 0 _aElectronics.
650 0 _aSystems engineering.
650 1 4 _aEngineering.
650 2 4 _aCircuits and Systems.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
650 2 4 _aComputer Hardware.
650 2 4 _aSystem Performance and Evaluation.
650 2 4 _aIndustrial and Production Engineering.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781846280238
856 4 0 _uhttp://dx.doi.org/10.1007/1-84628-173-3
912 _aZDB-2-ENG
999 _c74123
_d74123