000 01280nam a22003975i 4500
001 978-1-4419-9583-4
003 DE-He213
005 20130515021106.0
007 cr nn 008mamaa
008 110725s2011 xxu| s |||| 0|eng d
020 _a9781441995834
_9978-1-4419-9583-4
024 7 _a10.1007/978-1-4419-9583-4
_2doi
050 4 _aTA404.6
072 7 _aTGMT
_2bicssc
072 7 _aTEC021000
_2bisacsh
082 0 4 _a620.11
_223
100 1 _aEgerton, R.F.
245 1 0 _aElectron Energy-Loss Spectroscopy in the Electron Microscope
_h[electronic resource] /
_cby R.F. Egerton.
260 _aBoston, MA :
_bSpringer US,
_c2011.
300 _bdigital.
650 0 _aSpectroscopy.
650 0 _aNanotechnology.
650 0 _aSurfaces (Physics).
650 1 4 _aMaterials Science.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aSolid State Physics.
650 2 4 _aSpectroscopy and Microscopy.
650 2 4 _aSpectroscopy/Spectrometry.
650 2 4 _aNanotechnology.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781441995827
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4419-9583-4
912 _aZDB-2-CMS
999 _c73637
_d73637