000			01469nam a22004455i 4500
001			978-1-4419-7817-2
003			DE-He213
005			20130515021057.0
007			cr nn 008mamaa
008			110406s2011 xxu| s |||| 0|eng d
020			_a9781441978172 _9978-1-4419-7817-2
024	7		_a10.1007/978-1-4419-7817-2 _2doi
050		4	_aTP807-823
050		4	_aTA418.9.C6
072		7	_aTDCQ _2bicssc
072		7	_aTEC021000 _2bisacsh
082	0	4	_a620.14 _223
100	1		_aWalkosz, Weronika.
245	1	0	_aAtomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces _h[electronic resource] / _cby Weronika Walkosz.
260			_aNew York, NY : _bSpringer New York, _c2011.
300			_bdigital.
490	0		_aSpringer Theses
650		0	_aMicroreactors.
650		0	_aChemistry, Physical organic.
650		0	_aMaterials.
650	1	4	_aMaterials Science.
650	2	4	_aCeramics, Glass, Composites, Natural Methods.
650	2	4	_aSpectroscopy and Microscopy.
650	2	4	_aPhysical Chemistry.
650	2	4	_aStructural Materials.
650	2	4	_aAtomic/Molecular Structure and Spectra.
650	2	4	_aMicroengineering.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781441978165
830		0	_aSpringer Theses
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4419-7817-2
912			_aZDB-2-CMS
999			_c73452 _d73452