000			01442nam a22004335i 4500
001			978-1-4419-6993-4
003			DE-He213
005			20130515021044.0
007			cr nn 008mamaa
008			100927s2011 xxu| s |||| 0|eng d
020			_a9781441969934 _9978-1-4419-6993-4
024	7		_a10.1007/978-1-4419-6993-4 _2doi
050		4	_aTK7888.4
072		7	_aTJFC _2bicssc
072		7	_aTEC008010 _2bisacsh
082	0	4	_a621.3815 _223
100	1		_aNicolaidis, Michael.
245	1	0	_aSoft Errors in Modern Electronic Systems _h[electronic resource] / _cedited by Michael Nicolaidis.
260			_aBoston, MA : _bSpringer US, _c2011.
300			_bdigital.
490	0		_aFrontiers in Electronic Testing, _x0929-1296 ; _v41
650		0	_aEngineering.
650		0	_aOperating systems (Computers).
650		0	_aComputer system performance.
650		0	_aComputer engineering.
650		0	_aSystems engineering.
650	1	4	_aEngineering.
650	2	4	_aCircuits and Systems.
650	2	4	_aSystem Performance and Evaluation.
650	2	4	_aPerformance and Reliability.
650	2	4	_aElectrical Engineering.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781441969927
830		0	_aFrontiers in Electronic Testing, _x0929-1296 ; _v41
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4419-6993-4
912			_aZDB-2-ENG
999			_c73255 _d73255