000 01285nam a22004095i 4500
001 978-1-4419-6018-4
003 DE-He213
005 20130515021034.0
007 cr nn 008mamaa
008 101109s2011 xxu| s |||| 0|eng d
020 _a9781441960184
_9978-1-4419-6018-4
024 7 _a10.1007/978-1-4419-6018-4
_2doi
050 4 _aTK7800-8360
050 4 _aTK7874-7874.9
072 7 _aTJF
_2bicssc
072 7 _aTEC008000
_2bisacsh
082 0 4 _a621.381
_223
100 1 _aHartzell, Allyson L.
245 1 0 _aMEMS Reliability
_h[electronic resource] /
_cby Allyson L. Hartzell, Mark G. da Silva, Herbert R. Shea.
250 _a1.
260 _aBoston, MA :
_bSpringer US,
_c2011.
300 _bdigital.
490 0 _aMEMS Reference Shelf,
_x1936-4407
650 0 _aEngineering.
650 0 _aElectronics.
650 1 4 _aEngineering.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
700 1 _ada Silva, Mark G.
700 1 _aShea, Herbert R.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781441960177
830 0 _aMEMS Reference Shelf,
_x1936-4407
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4419-6018-4
912 _aZDB-2-ENG
999 _c73050
_d73050