000 01481nam a22004455i 4500
001 978-1-4419-5975-1
003 DE-He213
005 20130515021033.0
007 cr nn 008mamaa
008 100715s2010 xxu| s |||| 0|eng d
020 _a9781441959751
_9978-1-4419-5975-1
024 7 _a10.1007/978-1-4419-5975-1
_2doi
050 4 _aTA404.6
072 7 _aTGMT
_2bicssc
072 7 _aTEC021000
_2bisacsh
082 0 4 _a620.11
_223
100 1 _aAyache, Jeanne.
245 1 0 _aSample Preparation Handbook for Transmission Electron Microscopy
_h[electronic resource] :
_bTechniques /
_cby Jeanne Ayache, Luc Beaunier, Jacqueline Boumendil, Gabrielle Ehret, Danièle Laub.
260 _aNew York, NY :
_bSpringer New York,
_c2010.
300 _bdigital.
650 0 _aMineralogy.
650 0 _aMicroscopy.
650 0 _aNanotechnology.
650 0 _aSurfaces (Physics).
650 1 4 _aMaterials Science.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aBiological Microscopy.
650 2 4 _aMineralogy.
650 2 4 _aNanotechnology.
700 1 _aBeaunier, Luc.
700 1 _aBoumendil, Jacqueline.
700 1 _aEhret, Gabrielle.
700 1 _aLaub, Danièle.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781441959744
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4419-5975-1
912 _aZDB-2-CMS
999 _c73041
_d73041