000			01610nam a22004815i 4500
001			978-1-4419-5760-3
003			DE-He213
005			20130515021032.0
007			cr nn 008mamaa
008			110204s2011 xxu| s |||| 0|eng d
020			_a9781441957603 _9978-1-4419-5760-3
024	7		_a10.1007/978-1-4419-5760-3 _2doi
050		4	_aTK7800-8360
050		4	_aTK7874-7874.9
072		7	_aTJF _2bicssc
072		7	_aTEC008000 _2bisacsh
082	0	4	_a621.381 _223
100	1		_aLiu, Johan.
245	1	0	_aReliability of Microtechnology _h[electronic resource] : _bInterconnects, Devices and Systems / _cby Johan Liu, Olli Salmela, Jussi Sarkka, James E. Morris, Per-Erik Tegehall, Cristina Andersson.
250			_a1.
260			_aNew York, NY : _bSpringer New York, _c2011.
300			_bdigital.
650		0	_aEngineering.
650		0	_aSystem safety.
650		0	_aElectronics.
650		0	_aOptical materials.
650	1	4	_aEngineering.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aOptical and Electronic Materials.
650	2	4	_aQuality Control, Reliability, Safety and Risk.
650	2	4	_aNanotechnology and Microengineering.
700	1		_aSalmela, Olli.
700	1		_aSarkka, Jussi.
700	1		_aMorris, James E.
700	1		_aTegehall, Per-Erik.
700	1		_aAndersson, Cristina.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781441957597
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4419-5760-3
912			_aZDB-2-ENG
999			_c73004 _d73004