000 01439nam a22004095i 4500
001 978-1-4419-1200-8
003 DE-He213
005 20130515021021.0
007 cr nn 008mamaa
008 100721s2010 xxu| s |||| 0|eng d
020 _a9781441912008
_9978-1-4419-1200-8
024 7 _a10.1007/978-1-4419-1200-8
_2doi
050 4 _aTA1671-1707
050 4 _aTA1501-1820
072 7 _aTTBL
_2bicssc
072 7 _aTEC019000
_2bisacsh
082 0 4 _a621.36
_223
100 1 _aSirenko, Yuriy K.
245 1 0 _aModern Theory of Gratings
_h[electronic resource] :
_bResonant Scattering: Analysis Techniques and Phenomena /
_cedited by Yuriy K. Sirenko, Staffan Ström.
260 _aNew York, NY :
_bSpringer New York,
_c2010.
300 _bdigital.
490 0 _aSpringer Series in Optical Sciences,
_x0342-4111 ;
_v153
650 0 _aPhysics.
650 0 _aMicrowaves.
650 1 4 _aPhysics.
650 2 4 _aLaser Technology, Photonics.
650 2 4 _aMicrowaves, RF and Optical Engineering.
650 2 4 _aOptics, Optoelectronics, Plasmonics and Optical Devices.
700 1 _aStröm, Staffan.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781441911995
830 0 _aSpringer Series in Optical Sciences,
_x0342-4111 ;
_v153
856 4 0 _uhttp://dx.doi.org/10.1007/978-1-4419-1200-8
912 _aZDB-2-PHA
999 _c72823
_d72823