| 000 | 01430nam a22004215i 4500 | ||
|---|---|---|---|
| 001 | 978-1-4419-0938-1 | ||
| 003 | DE-He213 | ||
| 005 | 20130515021018.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100301s2010 xxu| s |||| 0|eng d | ||
| 020 |
_a9781441909381 _9978-1-4419-0938-1 |
||
| 024 | 7 |
_a10.1007/978-1-4419-0938-1 _2doi |
|
| 050 | 4 | _aTK7888.4 | |
| 072 | 7 |
_aTJFC _2bicssc |
|
| 072 | 7 |
_aTEC008010 _2bisacsh |
|
| 082 | 0 | 4 |
_a621.3815 _223 |
| 100 | 1 | _aBosio, Alberto. | |
| 245 | 1 | 0 |
_aAdvanced Test Methods for SRAMs _h[electronic resource] : _bEffective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / _cby Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel. |
| 250 | _a1. | ||
| 260 |
_aBoston, MA : _bSpringer US, _c2010. |
||
| 300 | _bdigital. | ||
| 650 | 0 | _aEngineering. | |
| 650 | 0 | _aComputer aided design. | |
| 650 | 0 | _aSystems engineering. | |
| 650 | 1 | 4 | _aEngineering. |
| 650 | 2 | 4 | _aCircuits and Systems. |
| 650 | 2 | 4 | _aComputer-Aided Engineering (CAD, CAE) and Design. |
| 700 | 1 | _aDilillo, Luigi. | |
| 700 | 1 | _aGirard, Patrick. | |
| 700 | 1 | _aPravossoudovitch, Serge. | |
| 700 | 1 | _aVirazel, Arnaud. | |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9781441909374 |
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-1-4419-0938-1 |
| 912 | _aZDB-2-ENG | ||
| 999 |
_c72752 _d72752 |
||