| 000 | 01373nam a22003975i 4500 | ||
|---|---|---|---|
| 001 | 978-1-4020-8363-1 | ||
| 003 | DE-He213 | ||
| 005 | 20130515020852.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100301s2008 ne | s |||| 0|eng d | ||
| 020 |
_a9781402083631 _9978-1-4020-8363-1 |
||
| 024 | 7 |
_a10.1007/978-1-4020-8363-1 _2doi |
|
| 050 | 4 | _aTK7888.4 | |
| 072 | 7 |
_aTJFC _2bicssc |
|
| 072 | 7 |
_aTEC008010 _2bisacsh |
|
| 082 | 0 | 4 |
_a621.3815 _223 |
| 100 | 1 | _aPavlov, Andrei. | |
| 245 | 1 | 0 |
_aCMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies _h[electronic resource] : _bProcess-Aware SRAM Design and Test / _cby Andrei Pavlov, Manoj Sachdev. |
| 260 |
_aDordrecht : _bSpringer Netherlands, _c2008. |
||
| 300 | _bdigital. | ||
| 490 | 0 |
_aFrontiers In Electronic Testing, _x0929-1296 ; _v40 |
|
| 650 | 0 | _aEngineering. | |
| 650 | 0 | _aMemory management (Computer science). | |
| 650 | 0 | _aSystems engineering. | |
| 650 | 1 | 4 | _aEngineering. |
| 650 | 2 | 4 | _aCircuits and Systems. |
| 650 | 2 | 4 | _aMemory Structures. |
| 700 | 1 | _aSachdev, Manoj. | |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9781402083624 |
| 830 | 0 |
_aFrontiers In Electronic Testing, _x0929-1296 ; _v40 |
|
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-1-4020-8363-1 |
| 912 | _aZDB-2-ENG | ||
| 999 |
_c71008 _d71008 |
||