000			01459nam a22004455i 4500
001			978-1-4020-5646-8
003			DE-He213
005			20130515020816.0
007			cr nn 008mamaa
008			100301s2007 ne | s |||| 0|eng d
020			_a9781402056468 _9978-1-4020-5646-8
024	7		_a10.1007/978-1-4020-5646-8 _2doi
050		4	_aTK7888.4
072		7	_aTJFC _2bicssc
072		7	_aTEC008010 _2bisacsh
082	0	4	_a621.3815 _223
100	1		_aVELAZCO, RAOUL.
245	1	0	_aRadiation Effects on Embedded Systems _h[electronic resource] / _cedited by RAOUL VELAZCO, PASCAL FOUILLAT, RICARDO REIS.
260			_aDordrecht : _bSpringer Netherlands, _c2007.
300			_bdigital.
650		0	_aEngineering.
650		0	_aElectronics.
650		0	_aSystems engineering.
650		0	_aNuclear engineering.
650		0	_aEnvironmental protection.
650	1	4	_aEngineering.
650	2	4	_aCircuits and Systems.
650	2	4	_aEffects of Radiation/Radiation Protection.
650	2	4	_aElectronic and Computer Engineering.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aNuclear Engineering.
700	1		_aFOUILLAT, PASCAL.
700	1		_aREIS, RICARDO.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781402056451
856	4	0	_uhttp://dx.doi.org/10.1007/978-1-4020-5646-8
912			_aZDB-2-ENG
999			_c70343 _d70343