| 000 | 01628nam a22004575i 4500 | ||
|---|---|---|---|
| 001 | 978-1-4020-5315-3 | ||
| 003 | DE-He213 | ||
| 005 | 20130515020807.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100301s2006 ne | s |||| 0|eng d | ||
| 020 |
_a9781402053153 _9978-1-4020-5315-3 |
||
| 024 | 7 |
_a10.1007/1-4020-5315-0 _2doi |
|
| 050 | 4 | _aTK7888.4 | |
| 072 | 7 |
_aTJFC _2bicssc |
|
| 072 | 7 |
_aTEC008010 _2bisacsh |
|
| 082 | 0 | 4 |
_a621.3815 _223 |
| 100 | 1 | _aSánchez, Gloria Huertas. | |
| 245 | 1 | 0 |
_aOscillation-Based Test in Mixed-Signal Circuits _h[electronic resource] / _cby Gloria Huertas Sánchez, Diego Vázquez García de la Vega, Adoración Rueda Rueda, José Luis Huertas Díaz. |
| 260 |
_aDordrecht : _bSpringer Netherlands, _c2006. |
||
| 300 | _bdigital. | ||
| 490 | 0 |
_aFrontiers in Electronic Testing, _x0929-1296 ; _v36 |
|
| 650 | 0 | _aEngineering. | |
| 650 | 0 | _aEngineering design. | |
| 650 | 0 | _aElectronics. | |
| 650 | 0 | _aSystems engineering. | |
| 650 | 1 | 4 | _aEngineering. |
| 650 | 2 | 4 | _aCircuits and Systems. |
| 650 | 2 | 4 | _aElectronic and Computer Engineering. |
| 650 | 2 | 4 | _aEngineering Design. |
| 650 | 2 | 4 | _aElectronics and Microelectronics, Instrumentation. |
| 700 | 1 | _aGarcía de la Vega, Diego Vázquez. | |
| 700 | 1 | _aRueda, Adoración Rueda. | |
| 700 | 1 | _aDíaz, José Luis Huertas. | |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9781402053146 |
| 830 | 0 |
_aFrontiers in Electronic Testing, _x0929-1296 ; _v36 |
|
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/1-4020-5315-0 |
| 912 | _aZDB-2-ENG | ||
| 999 |
_c70197 _d70197 |
||