000			01438nam a22003615i 4500
001			978-1-4020-2170-1
003			DE-He213
005			20130515020708.0
007			cr nn 008mamaa
008			100301s2005 ne | s |||| 0|eng d
020			_a9781402021701 _9978-1-4020-2170-1
024	7		_a10.1007/1-4020-2170-4 _2doi
100	1		_aSikula, Josef.
245	1	0	_aAdvanced Experimental Methods For Noise Research in Nanoscale Electronic Devices _h[electronic resource] / _cedited by Josef Sikula, Michael Levinshtein.
260			_aDordrecht : _bSpringer Netherlands, _c2005.
300			_bdigital.
490	0		_aNATO Science Series II: Mathematics, Physics and Chemistry, II. Mathematics, Physics and Chemistry, _x1568-2609 ; _v151
650		0	_aPhysics.
650		0	_aWeights and measures.
650		0	_aOptical materials.
650	1	4	_aPhysics.
650	2	4	_aOptical and Electronic Materials.
650	2	4	_aElectronic and Computer Engineering.
650	2	4	_aMeasurement Science, Instrumentation.
700	1		_aLevinshtein, Michael.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9781402021695
830		0	_aNATO Science Series II: Mathematics, Physics and Chemistry, II. Mathematics, Physics and Chemistry, _x1568-2609 ; _v151
856	4	0	_uhttp://dx.doi.org/10.1007/1-4020-2170-4
912			_aZDB-2-PHA
999			_c69149 _d69149