000			01742nam a22005175i 4500
001			978-0-85729-310-7
003			DE-He213
005			20130515020701.0
007			cr nn 008mamaa
008			110326s2011 xxk| s |||| 0|eng d
020			_a9780857293107 _9978-0-85729-310-7
024	7		_a10.1007/978-0-85729-310-7 _2doi
050		4	_aTA169.7
050		4	_aT55-T55.3
050		4	_aTA403.6
072		7	_aTGPR _2bicssc
072		7	_aTEC032000 _2bisacsh
082	0	4	_a658.56 _223
100	1		_aTan, Cher Ming.
245	1	0	_aApplications of Finite Element Methods for Reliability Studies on ULSI Interconnections _h[electronic resource] / _cby Cher Ming Tan, Wei Li, Zhenghao Gan, Yuejin Hou.
250			_a1.
260			_aLondon : _bSpringer London, _c2011.
300			_bdigital.
490	0		_aSpringer Series in Reliability Engineering, _x1614-7839
650		0	_aEngineering.
650		0	_aDifferential equations, partial.
650		0	_aSystem safety.
650		0	_aElectronics.
650		0	_aOptical materials.
650	1	4	_aEngineering.
650	2	4	_aQuality Control, Reliability, Safety and Risk.
650	2	4	_aComputational Intelligence.
650	2	4	_aElectronics and Microelectronics, Instrumentation.
650	2	4	_aOptical and Electronic Materials.
650	2	4	_aPartial Differential Equations.
700	1		_aLi, Wei.
700	1		_aGan, Zhenghao.
700	1		_aHou, Yuejin.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780857293091
830		0	_aSpringer Series in Reliability Engineering, _x1614-7839
856	4	0	_uhttp://dx.doi.org/10.1007/978-0-85729-310-7
912			_aZDB-2-ENG
999			_c69036 _d69036