000 01253nam a22003735i 4500
001 978-0-387-85731-2
003 DE-He213
005 20130515020625.0
007 cr nn 008mamaa
008 110414s2009 xxu| s |||| 0|eng d
020 _a9780387857312
_9978-0-387-85731-2
024 7 _a10.1007/978-0-387-85731-2
_2doi
050 4 _aTA404.6
072 7 _aTGMT
_2bicssc
072 7 _aTEC021000
_2bisacsh
082 0 4 _a620.11
_223
100 1 _aEchlin, Patrick.
245 1 0 _aHandbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
_h[electronic resource] /
_cby Patrick Echlin.
260 _aBoston, MA :
_bSpringer US,
_c2009.
300 _bdigital.
650 0 _aMicroscopy.
650 0 _aSurfaces (Physics).
650 1 4 _aMaterials Science.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aBiological Microscopy.
650 2 4 _aCondensed Matter Physics.
650 2 4 _aBiophysics and Biological Physics.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9780387857305
856 4 0 _uhttp://dx.doi.org/10.1007/978-0-387-85731-2
912 _aZDB-2-CMS
999 _c68449
_d68449