000 01452nam a22004335i 4500
001 978-0-387-75109-2
003 DE-He213
005 20130515020557.0
007 cr nn 008mamaa
008 100301s2008 xxu| s |||| 0|eng d
020 _a9780387751092
_9978-0-387-75109-2
024 7 _a10.1007/978-0-387-75109-2
_2doi
050 4 _aTA418.7-418.76
050 4 _aTA418.9.T45
072 7 _aTGM
_2bicssc
072 7 _aTEC021000
_2bisacsh
082 0 4 _a620.44
_223
100 1 _aPelliccione, Matthew.
245 1 0 _aEvolution of Thin Film Morphology
_h[electronic resource] :
_bModeling and Simulations /
_cby Matthew Pelliccione, Toh-Ming Lu.
260 _aNew York, NY :
_bSpringer New York,
_c2008.
300 _bdigital.
490 0 _aMaterials Science,
_x0933-033X ;
_v108
650 0 _aChemistry.
650 0 _aOptical materials.
650 0 _aChemistry, inorganic.
650 0 _aSurfaces (Physics).
650 1 4 _aChemistry.
650 2 4 _aSurfaces and Interfaces, Thin Films.
650 2 4 _aOptical and Electronic Materials.
650 2 4 _aTribology, Corrosion and Coatings.
700 1 _aLu, Toh-Ming.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9780387751085
830 0 _aMaterials Science,
_x0933-033X ;
_v108
856 4 0 _uhttp://dx.doi.org/10.1007/978-0-387-75109-2
912 _aZDB-2-CMS
999 _c67953
_d67953