000 01274nam a22004095i 4500
001 978-0-387-71754-8
003 DE-He213
005 20130515020540.0
007 cr nn 008mamaa
008 100301s2007 xxu| s |||| 0|eng d
020 _a9780387717548
_9978-0-387-71754-8
024 7 _a10.1007/978-0-387-71754-8
_2doi
050 4 _aTK5102.9
050 4 _aTA1637-1638
050 4 _aTK7882.S65
072 7 _aTTBM
_2bicssc
072 7 _aTEC008000
_2bisacsh
082 0 4 _a621.382
_223
100 1 _aAliev, Telman.
245 1 0 _aDigital Noise Monitoring of Defect Origin
_h[electronic resource] /
_cby Telman Aliev.
260 _aBoston, MA :
_bSpringer US,
_c2007.
300 _bdigital.
650 0 _aEngineering.
650 0 _aMathematics.
650 0 _aTelecommunication.
650 1 4 _aEngineering.
650 2 4 _aSignal, Image and Speech Processing.
650 2 4 _aApplications of Mathematics.
650 2 4 _aCommunications Engineering, Networks.
650 2 4 _aElectronic and Computer Engineering.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9780387717531
856 4 0 _uhttp://dx.doi.org/10.1007/978-0-387-71754-8
912 _aZDB-2-ENG
999 _c67622
_d67622