| 000 | 01385nam a22004215i 4500 | ||
|---|---|---|---|
| 001 | 978-0-387-39620-0 | ||
| 003 | DE-He213 | ||
| 005 | 20130515020503.0 | ||
| 007 | cr nn 008mamaa | ||
| 008 | 100301s2007 xxu| s |||| 0|eng d | ||
| 020 |
_a9780387396200 _9978-0-387-39620-0 |
||
| 024 | 7 |
_a10.1007/978-0-387-39620-0 _2doi |
|
| 050 | 4 | _aT174.7 | |
| 050 | 4 | _aTA418.9.N35 | |
| 072 | 7 |
_aTBN _2bicssc |
|
| 072 | 7 |
_aTEC027000 _2bisacsh |
|
| 082 | 0 | 4 |
_a620.115 _223 |
| 100 | 1 | _aZhou, Weilie. | |
| 245 | 1 | 0 |
_aScanning Microscopy for Nanotechnology _h[electronic resource] : _bTechniques and Applications / _cedited by Weilie Zhou, Zhong Lin Wang. |
| 260 |
_aNew York, NY : _bSpringer New York, _c2007. |
||
| 300 | _bdigital. | ||
| 650 | 0 | _aChemistry. | |
| 650 | 0 | _aOptical materials. | |
| 650 | 0 | _aNanotechnology. | |
| 650 | 0 | _aSurfaces (Physics). | |
| 650 | 1 | 4 | _aChemistry. |
| 650 | 2 | 4 | _aNanotechnology. |
| 650 | 2 | 4 | _aCharacterization and Evaluation of Materials. |
| 650 | 2 | 4 | _aOptical and Electronic Materials. |
| 650 | 2 | 4 | _aMeasurement Science and Instrumentation. |
| 700 | 1 | _aWang, Zhong Lin. | |
| 710 | 2 | _aSpringerLink (Online service) | |
| 773 | 0 | _tSpringer eBooks | |
| 776 | 0 | 8 |
_iPrinted edition: _z9780387333250 |
| 856 | 4 | 0 | _uhttp://dx.doi.org/10.1007/978-0-387-39620-0 |
| 912 | _aZDB-2-CMS | ||
| 999 |
_c67039 _d67039 |
||