000			01515nam a22004335i 4500
001			978-0-387-37231-0
003			DE-He213
005			20130515020500.0
007			cr nn 008mamaa
008			100301s2006 xxu| s |||| 0|eng d
020			_a9780387372310 _9978-0-387-37231-0
024	7		_a10.1007/0-387-37231-8 _2doi
100	1		_aFoster, Adam.
245	1	0	_aScanning Probe Microscopy _h[electronic resource] : _bAtomic Scale Engineering by Forces and Currents / _cby Adam Foster, Werner Hofer.
260			_aNew York, NY : _bSpringer New York, _c2006.
300			_bdigital.
490	0		_aNanoScience and Technology, _x1434-4904
650		0	_aChemistry.
650		0	_aMicroscopy.
650		0	_aMolecular structure.
650		0	_aParticles (Nuclear physics).
650		0	_aNanotechnology.
650		0	_aSurfaces (Physics).
650	1	4	_aChemistry.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aNanotechnology.
650	2	4	_aSurfaces and Interfaces, Thin Films.
650	2	4	_aAtomic and Molecular Structure and Spectra.
650	2	4	_aSolid State Physics and Spectroscopy.
650	2	4	_aBiological Microscopy.
700	1		_aHofer, Werner.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780387400907
830		0	_aNanoScience and Technology, _x1434-4904
856	4	0	_uhttp://dx.doi.org/10.1007/0-387-37231-8
912			_aZDB-2-CMS
999			_c66970 _d66970