000			01429nam a22004095i 4500
001			978-0-387-28668-6
003			DE-He213
005			20130515020428.0
007			cr nn 008mamaa
008			100301s2007 xxu| s |||| 0|eng d
020			_a9780387286686 _9978-0-387-28668-6
024	7		_a10.1007/978-0-387-28668-6 _2doi
100	1		_aKalinin, Sergei.
245	1	0	_aScanning Probe Microscopy _h[electronic resource] : _bElectrical and Electromechanical Phenomena at the Nanoscale / _cedited by Sergei Kalinin, Alexei Gruverman.
260			_aNew York, NY : _bSpringer New York, _c2007.
300			_bdigital.
650		0	_aChemistry.
650		0	_aMicroscopy.
650		0	_aParticles (Nuclear physics).
650		0	_aMechanical engineering.
650		0	_aNanotechnology.
650		0	_aSurfaces (Physics).
650	1	4	_aChemistry.
650	2	4	_aCharacterization and Evaluation of Materials.
650	2	4	_aNanotechnology.
650	2	4	_aSurfaces and Interfaces, Thin Films.
650	2	4	_aBiological Microscopy.
650	2	4	_aMechanical Engineering.
650	2	4	_aSolid State Physics and Spectroscopy.
700	1		_aGruverman, Alexei.
710	2		_aSpringerLink (Online service)
773	0		_tSpringer eBooks
776	0	8	_iPrinted edition: _z9780387286679
856	4	0	_uhttp://dx.doi.org/10.1007/978-0-387-28668-6
912			_aZDB-2-CMS
999			_c66334 _d66334