000 01189nam a22003615i 4500
001 978-0-387-26016-7
003 DE-He213
005 20130515020411.0
007 cr nn 008mamaa
008 100301s2005 xxu| s |||| 0|eng d
020 _a9780387260167
_9978-0-387-26016-7
024 7 _a10.1007/b136495
_2doi
100 1 _aEgerton, Ray F.
245 1 0 _aPhysical Principles of Electron Microscopy
_h[electronic resource] :
_bAn Introduction to TEM, SEM, and AEM /
_cby Ray F. Egerton.
260 _aBoston, MA :
_bSpringer US,
_c2005.
300 _bdigital.
650 0 _aChemistry.
650 0 _aMicroscopy.
650 0 _aElectromagnetism.
650 0 _aNanotechnology.
650 0 _aSurfaces (Physics).
650 1 4 _aChemistry.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aNanotechnology.
650 2 4 _aBiological Microscopy.
650 2 4 _aElectromagnetism, Optics and Lasers.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9780387258003
856 4 0 _uhttp://dx.doi.org/10.1007/b136495
912 _aZDB-2-CMS
999 _c66049
_d66049