000 01392nam a22004215i 4500
001 978-0-387-25624-5
003 DE-He213
005 20130515020409.0
007 cr nn 008mamaa
008 100301s2005 xxu| s |||| 0|eng d
020 _a9780387256245
_9978-0-387-25624-5
024 7 _a10.1007/b135763
_2doi
050 4 _aTK1-9971
072 7 _aTHR
_2bicssc
072 7 _aTEC007000
_2bisacsh
082 0 4 _a621.3
_223
100 1 _aLarsson, Erik.
245 1 0 _aIntroduction to Advanced System-on-Chip Test Design and Optimization
_h[electronic resource] /
_cby Erik Larsson.
260 _aBoston, MA :
_bSpringer US,
_c2005.
300 _bdigital.
490 0 _aFrontiers in Electronic Testing,
_x0929-1296 ;
_v29
650 0 _aEngineering.
650 0 _aEngineering design.
650 0 _aElectronics.
650 0 _aOptical materials.
650 1 4 _aEngineering.
650 2 4 _aElectronic and Computer Engineering.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
650 2 4 _aEngineering Design.
650 2 4 _aOptical and Electronic Materials.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781402032073
830 0 _aFrontiers in Electronic Testing,
_x0929-1296 ;
_v29
856 4 0 _uhttp://dx.doi.org/10.1007/b135763
912 _aZDB-2-ENG
999 _c65996
_d65996