000 01233nam a22003735i 4500
001 978-0-387-23395-6
003 DE-He213
005 20130515020359.0
007 cr nn 008mamaa
008 100301s2005 xxu| s |||| 0|eng d
020 _a9780387233956
_9978-0-387-23395-6
024 7 _a10.1007/b101202
_2doi
100 1 _aZhu, Yimei.
245 1 0 _aModern Techniques for Characterizing Magnetic Materials
_h[electronic resource] /
_cedited by Yimei Zhu.
260 _aBoston, MA :
_bSpringer US,
_c2005.
300 _bdigital.
650 0 _aChemistry.
650 0 _aCondensed matter.
650 0 _aMagnetism.
650 0 _aElectronics.
650 0 _aSurfaces (Physics).
650 1 4 _aChemistry.
650 2 4 _aCharacterization and Evaluation of Materials.
650 2 4 _aMagnetism, Magnetic Materials.
650 2 4 _aElectronics and Microelectronics, Instrumentation.
650 2 4 _aSurfaces and Interfaces, Thin Films.
650 2 4 _aCondensed Matter.
710 2 _aSpringerLink (Online service)
773 0 _tSpringer eBooks
776 0 8 _iPrinted edition:
_z9781402080074
856 4 0 _uhttp://dx.doi.org/10.1007/b101202
912 _aZDB-2-CMS
999 _c65753
_d65753